Please contact the contributing institution for more information regarding the copyright status of this object.
"100 Million Test Signals Per Second. An operator uses a vacuum pencil to place a wafer full of Very Large Scale Integration (VLSI) chips on the pedestal of a memory test system. The system generates 100 million test signals per second. It can test more than 75,000 components on 200 computer chips in less than 10 minutes. The system is designed to check thousands of chips daily for operating efficiency at various temperature and power ranges."